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[IEEE 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. - Beijing, China (Oct. 18-21, 2004)] Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. - Correlated double sample design for CMOS image readout IC

✍ Scribed by Gao Jun, ; Chen Zhongjian, ; Lu Wengao, ; Cui Wentao, ; Ji Lijiu,

Book ID: 121465983
Publisher: IEEE
Year: 2004
Weight: 856 KB
Volume: 2
Category: Article
ISBN-13: 9780780385115
DOI: 10.1109/ICSICT.2004.1436861

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