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[IEEE 6th International Conference on Solid-State and IC Technology - Shanghai, China (22-25 Oct. 2001)] 2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443) - The reduction of the leakage current of radiation detectors by a simple cap implantation process

✍ Scribed by Dejun Han, ; Chuanmin Wang, ; Shuchen Du,

Book ID: 120545193
Publisher: IEEE
Year: 2001
Weight: 161 KB
Volume: 2
Category: Article
ISBN-13: 9780780365209
DOI: 10.1109/ICSICT.2001.982140

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