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[IEEE 6th International Conference on Solid-State and IC Technology - Shanghai, China (22-25 Oct. 2001)] 2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443) - SEM investigation on IGBT latch-up failure

✍ Scribed by Wuchen Wu, ; Changyong Fan, ; Yajie Wang, ; Yangang Wang, ; Xueqing Cui, ; Jacob, P.; Held, M.

Book ID: 115481376
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 213 KB
Edition: 2001 ed.
Volume: 2
Category: Article
ISBN-13: 9780780365209
DOI: 10.1109/icsict.2001.982074

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