[IEEE 6th IEEE Conference Record., Instrumentation and Measurement Technology Conference - Washington, DC, USA (25-27 April 1989)] 6th IEEE Conference Record., Instrumentation and Measurement Technology Conference - High accuracy location of faults on electrical lines using digital processing of sampled data records from a reflectogram

✍ Scribed by Van Biesen, L.P.; Renneboog, J.; Barel, A.R.F.

• Book ID: 118183263
• Publisher: IEEE
• Year: 1989
• Weight: 434 KB
• Volume: 0
• Category: Article
• DOI: 10.1109/imtc.1989.36904