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[IEEE 64th ARFTG Microwave Measurements Conference, Fall 2004. - Orlando, FL, USA (Dec. 2-3, 2004)] 64th ARFTG Microwave Measurements Conference, Fall 2004. - On-chip microwave test circuits for production IC measurements

✍ Scribed by Eisenstadt, W.R.; Fox, R.M.; Qizhang Yin, ; Jang-Sup Yoon, ; Tao Zhang,

Book ID: 126662798
Publisher: IEEE
Year: 2004
Weight: 865 KB
Category: Article
ISBN-13: 9780780389526
DOI: 10.1109/ARFTGF.2004.1427602

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