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[IEEE 60th ARFTG Conference Digest Fall 2002. Automatic RF Techniques Group. Measurements Needs for Emerging Technologies - Washington, DC, USA (5-6 Dec. 2002)] 60th ARFTG Conference Digest, Fall 2002. - Nose-to-nose oscilloscope calibration phase error inherent in the sampling circuitry

✍ Scribed by Remley, K.A.

Book ID: 126634504
Publisher: IEEE
Year: 2002
Weight: 849 KB
Category: Article
ISBN-13: 9780780381247
DOI: 10.1109/ARFTGF.2002.1218690

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