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[IEEE 60th ARFTG Conference Digest Fall 2002. Automatic RF Techniques Group. Measurements Needs for Emerging Technologies - Washington, DC, USA (5-6 Dec. 2002)] 60th ARFTG Conference Digest, Fall 2002. - Nose-to-nose oscilloscope calibration phase error inherent in the sampling circuitry

โœ Scribed by Remley, K.A.


Book ID
126634504
Publisher
IEEE
Year
2002
Weight
849 KB
Category
Article
ISBN-13
9780780381247

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