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[IEEE 5th International Conference on Properties and Applications of Dielectric Materials - Seoul, South Korea (25-30 May 1997)] Proceedings of 5th International Conference on Properties and Applications of Dielectric Materials - Frequency-tuned resonant test systems for HV on-site testing of XLPE cables and SF/sub 6/ insulated apparatus

✍ Scribed by Hauschild, W.

Book ID: 126978019
Publisher: IEEE
Year: 1997
Weight: 693 KB
Volume: 2
Category: Article
ISBN-13: 9780780326514
DOI: 10.1109/icpadm.1997.616654

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