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[IEEE 5th International Conference on Properties and Applications of Dielectric Materials - Seoul, South Korea (25-30 May 1997)] Proceedings of 5th International Conference on Properties and Applications of Dielectric Materials - A study of volume resistivity for high voltage power cable semiconducting layer

✍ Scribed by Masuda, M.; Ogata, A.; Nitta, M.; Tani, T.

Book ID: 118277106
Publisher: IEEE
Year: 1997
Weight: 265 KB
Volume: 1
Category: Article
ISBN-13: 9780780326514
DOI: 10.1109/icpadm.1997.617620

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