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[IEEE 5th International Conference on Properties and Applications of Dielectric Materials - Seoul, South Korea (25-30 May 1997)] Proceedings of 5th International Conference on Properties and Applications of Dielectric Materials - Aging recognition of partial discharge patterns using neural network and semi-fractal dimension

✍ Scribed by Lim Jang-Seob, ; Park Young-Sik, ; Kim Cheol-Su, ; Jeong Myoung-Rae, ; Jung Woo-Sung, ; Kim Tae-Sung,

Book ID: 118018868
Publisher: IEEE
Year: 1997
Weight: 324 KB
Volume: 1
Category: Article
ISBN-13: 9780780326514
DOI: 10.1109/icpadm.1997.617585

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