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[IEEE 5th IEEE Conference on Nanotechnology, 2005. - Nagoya, Japan (July 11-15, 2005)] 5th IEEE Conference on Nanotechnology, 2005. - Reliability modeling of nanoelectronic circuits

โœ Scribed by Jie Han, ; Taylor, E.; Jianbo Gao, ; Fortes, J.


Book ID
126732229
Publisher
IEEE
Year
2005
Weight
317 KB
Category
Article
ISBN-13
9780780391994

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