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[IEEE 58th DRC. Device Research Conference - Denver, CO, USA (19-21 June 2000)] 58th DRC. Device Research Conference. Conference Digest (Cat. No.00TH8526) - Dark current reduction and operational wavelength shift in normal incidence InAs-GaAs QDIPs through the introduction of AlGaAs layers in the active region of the detector

✍ Scribed by Baklenov, O.; Chen, Z.H.; Kim, E.T.; Mukhametzhanov, I.; Madhukar, A.; Ma, F.; Ye, Z.; Yang, B.; Campbell, J.

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