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[IEEE 54th ARFTG Conference Digest - Atlanta, GA, USA (1999.12.2-1999.12.3)] 54th ARFTG Conference Digest - The effect of load variations on on-wafer lumped element based calibrations

โœ Scribed by Kirby, Pete; Dunleavy, Lawrence; Weller, Thomas


Book ID
126615948
Publisher
IEEE
Year
2000
Tongue
English
Weight
318 KB
Category
Article
ISBN-13
9780780356863

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