[IEEE 53rd ARFTG Conference Digest - Anaheim, CA, USA (1999.06.17-1999.06.18)] 53rd ARFTG Conference Digest - S-Parameter Measurement Based Equivalent Circuit Models for Slotline and NRD Resonators

✍ Scribed by Schreurs, D.; Pertz, O.; Philibert, W.; Beyer, A.; Nauwelaers, B.

• Book ID: 120575347
• Publisher: IEEE
• Year: 1999
• Tongue: English
• Weight: 85 KB
• Category: Article
• ISBN-13: 9780780356863
• DOI: 10.1109/ARFTG.1999.327355