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[IEEE 51st Electronic Components and Technology Conference 2001. Proceedings - Orlando, FL, USA (29 May-1 June 2001)] 2001 Proceedings. 51st Electronic Components and Technology Conference (Cat. No.01CH37220) - An experimental study of failure and fatigue life of a stacked CSP subjected to cyclic bending

✍ Scribed by Wu, J.D.; Ho, S.H.; Zheng, P.J.; Liao, C.C.; Hung, S.C.

Book ID: 126703241
Publisher: IEEE
Year: 2001
Weight: 841 KB
Category: Article
ISBN-13: 9780780370388
DOI: 10.1109/ECTC.2001.927952

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