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[IEEE 51st ARFTG Conference Digest - Baltimore, MD, USA (1998.06.12-1998.06.12)] 51st ARFTG Conference Digest - Accurate Characteristic Impedance Measurement on Silicon

✍ Scribed by Williams, Dylan F.; Arz, Uwe; Grabinski, Hartmut

No coin nor oath required. For personal study only.

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