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[IEEE 4th International Conference on ASIC - Shanghai, China (23-25 Oct. 2001)] ASICON 2001. 2001 4th International Conference on ASIC Proceedings (Cat. No.01TH8549) - Design of mixed-signal circuit for testability

✍ Scribed by Feng Jianhua, ; Sun Yihe, ; Li Shuguo,

Book ID: 126633793
Publisher: IEEE
Year: 2001
Weight: 353 KB
Category: Article
ISBN-13: 9780780366770
DOI: 10.1109/ICASIC.2001.982639

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