✦ LIBER ✦

[IEEE 4th IEEE Conference on Nanotechnology, 2004. - Munich, Germany (16-19 Aug. 2004)] 4th IEEE Conference on Nanotechnology, 2004. - Edge detection at height profiles with nano resolution

✍ Scribed by Topfer, S.; Mastylo, R.; Linss, G.; Manske, E.; Kuhn, O.; Nehse, U.

No coin nor oath required. For personal study only.

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