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[IEEE 4th IEEE Conference on Nanotechnology, 2004. - Munich, Germany (16-19 Aug. 2004)] 4th IEEE Conference on Nanotechnology, 2004. - Simulation of electrical characteristics of surrounding- and omega-shaped-gate nanowire FinFETs

✍ Scribed by Chien-Shao Tang, ; Shao-Ming Yu, ; Hong-Mu Chou, ; Jam-Wem Lee, ; Yiming Li,

No coin nor oath required. For personal study only.

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