[IEEE 45th ARFTG Conference Digest - Orlando, FL, USA (1995.05.19-1995.05.19)] 45th ARFTG Conference Digest - A New Measurement Method for Determination of Transistor Parameters

✍ Scribed by Chenakin, Alexander V.

• Book ID: 126638187
• Publisher: IEEE
• Year: 1995
• Tongue: English
• Weight: 282 KB
• Category: Article
• ISBN-13: 9780780356863
• DOI: 10.1109/ARFTG.1995.327100