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[IEEE 43rd IEEE Midwest Symposium on Circuits and Systems - Lansing, MI, USA (8-11 Aug. 2000)] Proceedings of the 43rd IEEE Midwest Symposium on Circuits and Systems (Cat.No.CH37144) - Very linear ramp-generators for high resolution ADC BIST and calibration

✍ Scribed by Jing Wang, ; Sanchez-Sinencio, E.; Maloberti, F.

Book ID: 115459933
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 351 KB
Volume: 2
Category: Article
ISBN-13: 9780780364752
DOI: 10.1109/mwscas.2000.952901

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