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[IEEE 42nd Midwest Symposium on Circuits and Systems - Las Cruces, NM, USA (8-11 Aug. 1999)] 42nd Midwest Symposium on Circuits and Systems (Cat. No.99CH36356) - A novel approach to efficient yield estimation for microwave integrated circuits

โœ Scribed by Swidzinski, J.F.; Keramat, M.; Chang, K.


Book ID
120280353
Publisher
IEEE
Year
2000
Weight
410 KB
Edition
1999, 42nd ed.
Volume
1
Category
Article
ISBN-13
9780780354913

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