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[IEEE 42nd IEEE International Conference on Decision and Control (IEEE Cat. No.03CH37475) - Maui, Hawaii, USA (Dec. 9-12, 2003)] 42nd IEEE International Conference on Decision and Control (IEEE Cat. No.03CH37475) - Sliding mode multiple observer for fault detection and isolation

✍ Scribed by Akhenak, A.; Chadli, M.; Maquin, D.; Ragot, J.

Book ID: 118269696
Publisher: IEEE
Year: 2003
Weight: 462 KB
Volume: 1
Category: Article
ISBN-13: 9780780379244
DOI: 10.1109/cdc.2003.1272690

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