[IEEE 41st ARFTG Conference Digest - Atlanta, GA, USA (1993.06.18-1993.06.18)] 41st ARFTG Conference Digest - An Automated W-Band On-Wafer Noise Figure Measurement System

✍ Scribed by Chen, Sian; Yang, Daniel C.; Wang, Huei; Hayashibara, Kit; Godshalk, Edward M.; Allen, Barry

• Book ID: 126268239
• Publisher: IEEE
• Year: 1993
• Tongue: English
• Weight: 454 KB
• Category: Article
• ISBN-13: 9780780356863
• DOI: 10.1109/ARFTG.1993.327019