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[IEEE 3rd International Conference on Properties and Applications of Dielectric Materials - Tokyo, Japan (8-12 July 1991)] [1991] Proceedings of the 3rd International Conference on Properties and Applications of Dielectric Materials - On the mechanism of dielectric breakdown of ceramic for HV capacitors

✍ Scribed by Wan Rongen, ; Chen Shoutian,

Book ID: 120621777
Publisher: IEEE
Year: 1991
Tongue: English
Weight: 192 KB
Category: Article
ISBN-13: 9780879425685
DOI: 10.1109/ICPADM.1991.172257

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