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[IEEE 3rd International Conference on Conduction and Breakdown in Solid Dielectrics - Trondheim, Norway (3-6 July 1989)] Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics - A model of aging of dielectric extruded cables

✍ Scribed by Crine, J.P.; Parpal, J.L.; Lessard, G.

Book ID: 123616976
Publisher: IEEE
Year: 1989
Weight: 200 KB
Category: Article
DOI: 10.1109/ICSD.1989.69218

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