[IEEE 38th ARFTG Conference Digest - San Diego, CA, USA (1991.12.5-1991.12.6)] 38th ARFTG Conference Digest - On-Wafer GaAs Schottky Diode Characterization Using an Integrated Pulse I-V/Pulse S-Parameter Measurement System

✍ Scribed by Winson, Peter B.; Pritchett, Sam D.

• Book ID: 126570520
• Publisher: IEEE
• Year: 1991
• Tongue: English
• Weight: 354 KB
• Category: Article
• ISBN-13: 9780780356863
• DOI: 10.1109/ARFTG.1991.324036