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[IEEE 37th IEEE Power Electronics Specialists Conference - Jeju, Korea (18-22 June 2006)] 37th IEEE Power Electronics Specialists Conference - Characterization of SiC JFET for Temperature Dependent Device Modeling

✍ Scribed by Funaki, T.; Kashyap, A.S.; Mantooth, H.A.; Balda, J.C.; Barlow, F.D.; Kimoto, T.; Hikihara, T.

No coin nor oath required. For personal study only.

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