[IEEE 37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07) - Edinburgh, UK (2007.06.25-2007.06.28)] 37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07) - Feedback Redundancy: A Power Efficient SEU-Tolerant Latch Design for Deep Sub-Micron Technologies

✍ Scribed by Fazeli, M.; Patooghy, A.; Miremadi, S.G.; Ejlali, A.

• Book ID: 118201397
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 540 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780769528557
• DOI: 10.1109/dsn.2007.51