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[IEEE 34th Annual Frontiers in Education, 2004. FIE 2004. - Savannah, GA, USA (Oct. 20-23, 2004)] 34th Annual Frontiers in Education, 2004. FIE 2004. - Minimizing the pain and maximizing the gain of assessment

โœ Scribed by Mechtel, D.; Voigt, R.


Book ID
126692948
Publisher
IEEE
Year
2004
Tongue
English
Weight
563 KB
Category
Article
ISBN-13
9780780385528

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