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[IEEE 33rd Applied Imagery Pattern Recognition Workshop (AIPR'04) - Washington, DC, USA (13-15 Oct. 2004)] 33rd Applied Imagery Pattern Recognition Workshop (AIPR'04) - Monitoring and Reporting of Fingerprint Image Quality and Match Accuracy for a Large User Application

✍ Scribed by Ko, T.; Krishnan, R.

Book ID: 125435854
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 86 KB
Category: Article
ISBN-13: 9780769522500
DOI: 10.1109/aipr.2004.30

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