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[IEEE 32nd Midwest Symposium on Circuits and Systems - Champaign, IL, USA (14-16 Aug. 1989)] Proceedings of the 32nd Midwest Symposium on Circuits and Systems - Modeling of capacitor loss in a thick-film RC active filter

✍ Scribed by Stephenson, F.W.; Burton, L.C.; Reddy, R.

Book ID: 126600642
Publisher: IEEE
Year: 1990
Weight: 175 KB
Category: Article
DOI: 10.1109/MWSCAS.1989.102073

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