[IEEE 32nd ARFTG Conference Digest - Tempe, AZ, USA (1988.12.1-1988.12.2)] 32nd ARFTG Conference Digest - Moving Reference Planes for On-Wafer Measurements Using The TRL Calibration Technique

✍ Scribed by Jeroma, Paul; Martin, Glenn

• Book ID: 126634503
• Publisher: IEEE
• Year: 1988
• Tongue: English
• Weight: 585 KB
• Category: Article
• ISBN-13: 9780780356863
• DOI: 10.1109/ARFTG.1988.323925