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[IEEE 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005. - Grenoble, France (Sept. 12-16, 2005)] Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005. - A new integrated charge pump architecture using dynamic biasing of pass transistors

✍ Scribed by Mensi, L.; Colalongo, L.; Richelli, A.; Kovacs-Vajna, Z.M.

Book ID: 120173280
Publisher: IEEE
Year: 2005
Weight: 409 KB
Category: Article
ISBN-13: 9780780392052
DOI: 10.1109/ESSCIR.2005.1541564

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