[IEEE 28th International Electronics Manufacturing Technology Symposium - San Jose, CA, USA (16-18 July 2003)] IEEE/CPMT/SEMI 28th International Electronics Manufacturing Technology Symposium, 2003. IEMT 2003. - Reliability ground rules change at >50 μm pitch

✍ Scribed by Singh, I.; Levine, L.; Brunner, J.

• Book ID: 121332612
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 377 KB
• Category: Article
• ISBN-13: 9780780379336
• DOI: 10.1109/IEMT.2003.1225875