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[IEEE 28th Annual Conference of the IEEE Industrial Electronics Society - Sevilla, Spain (5-8 Nov. 2002)] IEEE 2002 28th Annual Conference of the Industrial Electronics Society. IECON 02 - A generalized Epstein test method for the computation of core losses in induction motors

โœ Scribed by Torres, A.G.; Cardoso Filho, B.J.


Book ID
111950807
Publisher
IEEE
Year
2002
Weight
365 KB
Volume
2
Category
Article
ISBN-13
9780780374744

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