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[IEEE 23rd International Conference on Microelectronics (MIEL 2002) - Nis, Yugoslavia (12-15 May 2002)] 2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595) - H/sup +/ irradiation for reverse recovery softness and reliability of power p-i-n diodes for snubberless applications

✍ Scribed by Cova, P.; Menozzi, R.; Portesine, M.

Book ID: 120074673
Publisher: IEEE
Year: 2002
Weight: 219 KB
Volume: 1
Category: Article
ISBN-13: 9780780372351
DOI: 10.1109/MIEL.2002.1003160

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