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[IEEE 21st International Conference on VLSI Design (VLSID 2008) - Hyderabad, India (2008.01.4-2008.01.8)] 21st International Conference on VLSI Design (VLSID 2008) - Voltage and Temperature Scalable Gate Delay and Slew Models Including Intra-Gate Variations

✍ Scribed by Das, Bishnu Prasad; Amrutur, Janakiraman V. Bharadwaj; Jamadagni, H.S.; Arvind, N.V.

No coin nor oath required. For personal study only.

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