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[IEEE 21st IEEE/ACM International Conference on Automated Software Engineering (ASE'06) - Tokyo (2006.09.18-2006.09.22)] 21st IEEE/ACM International Conference on Automated Software Engineering (ASE'06) - Automatic Generation of Detection Algorithms for Design Defects

✍ Scribed by Moha, Naouel; Gueheneuc, Yann-gael; Leduc, Pierre

Book ID: 121475425
Publisher: IEEE
Year: 2006
Weight: 140 KB
Category: Article
ISBN-13: 9780769525792
DOI: 10.1109/ASE.2006.22

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