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[IEEE 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) - Bangalore, India (2007.01.6-2007.01.10)] 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) - Design and Testing of an Integrated Circuit for Multi-Electrode Neural Recording

✍ Scribed by Harrison, Reid; Watkins, Paul; Kier, Ryan; Black, Daniel; Lovejoy, Robert; Normann, Richard; Solzbacher, Florian

Book ID: 121275968
Publisher: IEEE
Year: 2007
Weight: 673 KB
Category: Article
ISBN-13: 9780769527628
DOI: 10.1109/VLSID.2007.63

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