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[IEEE 20th IEEE International Conference on Software Maintenance, 2004. Proceedings. - Chicago, IL, USA (11-14 Sept. 2004)] 20th IEEE International Conference on Software Maintenance, 2004. Proceedings. - Detection strategies: metrics-based rules for detecting design flaws

✍ Scribed by Marinescu, R.

Book ID: 121719901
Publisher: IEEE
Year: 2004
Weight: 503 KB
Category: Article
ISBN-13: 9780769522135
DOI: 10.1109/icsm.2004.1357820

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