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[IEEE 2014 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2014.4.28-2014.4.30)] Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test - Power-switch routing for reducing dynamic IR drop in multi-domain MTCMOS designs

✍ Scribed by Wang, Yi-Ming; Chao, Mango C.-T.; Chen, Shi-Hao; Li, Hung-Chun

Book ID: 126048429
Publisher: IEEE
Year: 2014
Weight: 765 KB
Category: Article
ISBN: 1479927767
DOI: 10.1109/VLSI-DAT.2014.6834873

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