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[IEEE 2014 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2014.4.28-2014.4.30)] Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test - An all-digital delay-locked loop for high-speed memory interface applications

✍ Scribed by Chen, Shih-Lun; Ho, Ming-Jing; Sun, Yu-Ming; Lin, Maung Wai; Lai, Jung-Chin

Book ID: 125540319
Publisher: IEEE
Year: 2014
Weight: 803 KB
Category: Article
ISBN: 1479927767
DOI: 10.1109/VLSI-DAT.2014.6834900

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