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[IEEE 2014 International Conference on Optimization, Reliabilty, and Information Technology (ICROIT) - Faridabad, Haryana, India (2014.02.6-2014.02.8)] 2014 International Conference on Reliability Optimization and Information Technology (ICROIT) - Finding outliers using mutual nearness based ranks detection algorithm

✍ Scribed by Gurjar, Ram Niwas; Sharma, Neeraj; Wadhwa, Manoj

Book ID: 124094348
Publisher: IEEE
Year: 2014
Weight: 377 KB
Category: Article
ISBN: 1479929964
DOI: 10.1109/ICROIT.2014.6798313

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