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[IEEE 2014 IEEE/MTT-S International Microwave Symposium - MTT 2014 - Tampa, FL, USA (2014.6.1-2014.6.6)] 2014 IEEE MTT-S International Microwave Symposium (IMS2014) - Adjoint sensitivity analysis of 3D problems with anisotropic materials

✍ Scribed by Kalantari, Laleh S.; Ahmed, Osman; Bakr, Mohamed H.; Nikolova, Natalia K.

Book ID: 125532060
Publisher: IEEE
Year: 2014
Tongue: English
Weight: 502 KB
Category: Article
ISBN: 1479938696
DOI: 10.1109/MWSYM.2014.6848468

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