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[IEEE 2014 IEEE Students' Conference on Electrical, Electronics and Computer Science (SCEECS) - Bhopal (2014.3.1-2014.3.2)] 2014 IEEE Students' Conference on Electrical, Electronics and Computer Science - Image denoising using orthonormal wavelet transform with stein unbiased risk estimator

✍ Scribed by Yadav, Manish; Yadav, Swati; Sharma, Dilip

Book ID: 124090866
Publisher: IEEE
Year: 2014
Weight: 508 KB
Category: Article
ISBN: 1479925268
DOI: 10.1109/SCEECS.2014.6804511

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