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[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Resilient and adaptive circuits for voltage, temperature, and reliability guardband reduction

โœ Scribed by Tokunaga, Carlos; Ryan, Joseph F.; Karnik, Tanay; Tschanz, James W.


Book ID
126940795
Publisher
IEEE
Year
2014
Weight
491 KB
Category
Article
ISBN
1479933171

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