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[IEEE 2014 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Montevideo, Uruguay (2014.5.12-2014.5.15)] 2014 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings - An ASIC for the measurement of low frequency noise in MOS transistors

✍ Scribed by Puyol, Rafael; Arnaud, Alfredo; Miguez, Matias; Gak, Joel

Book ID: 126452936
Publisher: IEEE
Year: 2014
Weight: 728 KB
Category: Article
ISBN: 1467363863
DOI: 10.1109/I2MTC.2014.6860855

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