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[IEEE 2014 IEEE Electrical Insulation Conference (EIC) - Philadelphia, PA, USA (2014.6.8-2014.6.11)] 2014 IEEE Electrical Insulation Conference (EIC) - SF6 contaminated by SO2: Dielectric strength and influence on sealing materials

✍ Scribed by Wilhelm, Helena M.; Mattoso, Mauricio; Gomez, Neffer A. G.; Fernandes, Paulo O.; Feitosa, Leandro; Cruz, Vanderlei; Meyer, Luiz H.

Book ID: 126653199
Publisher: IEEE
Year: 2014
Weight: 815 KB
Category: Article
ISBN: 1479927864
DOI: 10.1109/EIC.2014.6869434

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