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[IEEE 2014 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Tampa, FL, USA (2014.7.9-2014.7.11)] 2014 IEEE Computer Society Annual Symposium on VLSI - Characterization of MWCNT VLSI Interconnect with Self-Heating Induced Scatterings

✍ Scribed by Mohsin, K.M.; Srivastava, Ashok; Sharma, Ashwani K.; Mayberry, Clay

Book ID: 126940798
Publisher: IEEE
Year: 2014
Weight: 432 KB
Category: Article
ISBN: 1479937630
DOI: 10.1109/isvlsi.2014.31

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