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[IEEE 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS) - College Station, TX, USA (2014.8.3-2014.8.6)] 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS) - Data retention voltage analysis of various low-power SRAM topologies

✍ Scribed by Leochico, Kester; John, Eugene

Book ID: 126759333
Publisher: IEEE
Year: 2014
Weight: 594 KB
Category: Article
ISBN: 1479941344
DOI: 10.1109/MWSCAS.2014.6908564

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